Keywords:
- Data Mining
- fault diagnosis
- faulty product detection
- flaw detection
- growing self-organizing map algorithm
- large database
- manufactured products
- manufacturing data mining
- manufacturing data processing
- manufacturing process
- manufacturing processes
- pattern clustering
- product development
- product quality
- product yield
- quality control
- self-organising feature maps
- unsupervised clustering
- very large databases
Publications of Md A. Karim sorted by journal and type
Publications of type Inproceedings
2008
| , and , Detection of Faulty Products using Data Mining, in: Computer and Information Technology, 2008. ICCIT 2008. 11th International Conference on, pages 101 -107, 2008 |
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2006
| , , , , , and , Detection of Faulty Semiconductor Wafers using Dynamic Growing Self Organizing Map, in: Proceedings of the IEEE Tencon 2005, Melbourne, Australia, IEEE Operations Center, New Jersey, pages 761--766, Piscataway, 2006 |
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