Dear guest, welcome to this publication database. As an anonymous user, you will probably not have edit rights. Also, the collapse status of the topic tree will not be persistent. If you like to have these and other options enabled, you might ask Pascal Held for a login account.
| This site is powered by Aigaion - A PHP/Web based management system for shared and annotated bibliographies. For more information visit www.aigaion.nl. |
|
Keywords:
- Data Mining
- fault diagnosis
- faulty product detection
- flaw detection
- growing self-organizing map algorithm
- large database
- manufactured products
- manufacturing data mining
- manufacturing data processing
- manufacturing process
- manufacturing processes
- pattern clustering
- product development
- product quality
- product yield
- quality control
- self-organising feature maps
- unsupervised clustering
- very large databases
Publications of Md A. Karim
2008
| , and , Detection of Faulty Products using Data Mining, in: Computer and Information Technology, 2008. ICCIT 2008. 11th International Conference on, pages 101 -107, 2008 |
|
2006
| , , , , , and , Detection of Faulty Semiconductor Wafers using Dynamic Growing Self Organizing Map, in: Proceedings of the IEEE Tencon 2005, Melbourne, Australia, IEEE Operations Center, New Jersey, pages 761--766, Piscataway, 2006 |
|