TY  - CONF
ID  - Borgelt_and_Kruse_2005b
T1  - Probabilistic Graphical Models for the Diagnosis of Analog Electrical Circuits
A1  - Borgelt, Christian
A1  - Kruse, Rudolf
TI  - Proc. 8th European Conf. on Symbolic and Quantitative Approaches to Reasoning and Uncertainty (ECSQARU'05, Barcelona, Spain)
Y1  - 2005
SP  - 100
EP  - 110
PB  - Springer-Verlag
AD  - Heidelberg, Germany
UR  - http://www.springerlink.com/app/home/contribution.asp?wasp=333e72c03b0941f8a133a60dbf3c8408&referrer=parent&backto=issue,10,85;journal,14,2099;linkingpublicationresults,1:105633,1
ER  -